#include <Arduino.h>
#include <unity.h>
#include "storage_interface.h"
#include <EEPROM.h>

uint32_t epoch = 1764249314;

// WARNING : copy from storage interface (if somes changes are apply on storageinterface's OFFSET_ apply it here too)
static constexpr uint8_t OFFSET_MEASURES_SCH = 1, OFFSET_NB_PHOTO_SENSOR = 2, OFFSET_NB_TEMP_SENSOR = 3, OFFSET_PHOTO_MEASURES_SIZE = 4, OFFSET_TEMP_MEASURES_SIZE = 5, OFFSET_NB_MEASURES = 6, OFFSET_NEXT_PACKAGE = 8, OFFSET_START_DATA_MEASURES = 10; // unit in byte 
static constexpr uint16_t MEGA_2560_EEPROM_SIZE = 4096;

void test_set_struct(){
    Storage_interface test;
    uint16_t offset = 0;
    uint8_t schedule = 0, nb_photo_sensor = 2, nb_temp_sensor = 1, sizeofuint8 = sizeof(uint8_t);
    bool timestamp = true, is_final = true, photo_sensor = true, temp_sensor = true;

    /****  classic case test ****/
    test.set_struct(offset, timestamp, is_final, photo_sensor, temp_sensor, schedule, nb_photo_sensor, nb_temp_sensor, sizeofuint8, sizeofuint8);

    uint8_t flags;
    flags = EEPROM.read(offset);

    // if package flag right set
    TEST_ASSERT(flags & 0b10000000);

    // test schedule flags
    TEST_ASSERT(flags & 0b01000000);
    TEST_ASSERT(!(flags & 0b00100000));

    // test schedule
    TEST_ASSERT(EEPROM.read(offset + OFFSET_MEASURES_SCH) == schedule);

    // test photo res flag
    TEST_ASSERT(flags & 0b00010000);
    TEST_ASSERT(EEPROM.read(offset + OFFSET_NB_PHOTO_SENSOR) == nb_photo_sensor);

    // test temp flag
    TEST_ASSERT(flags & 0b00001000);
    TEST_ASSERT(EEPROM.read(offset + OFFSET_NB_TEMP_SENSOR) == nb_temp_sensor);

    // test if this package is the latest write
    TEST_ASSERT(flags & 0b00000100);

    // test type size write
    TEST_ASSERT(EEPROM.read(offset + OFFSET_PHOTO_MEASURES_SIZE) == sizeofuint8);
    TEST_ASSERT(EEPROM.read(offset + OFFSET_TEMP_MEASURES_SIZE) == sizeofuint8);

    /**** partial schedule timestamp case test  ****/
    schedule = 3;
    test.set_struct(offset, timestamp, is_final, photo_sensor, temp_sensor, schedule, nb_photo_sensor, nb_temp_sensor, sizeofuint8, sizeofuint8);

    flags = EEPROM.read(offset);

    // test schedule flags
    TEST_ASSERT(!(flags & 0b01000000));
    TEST_ASSERT(flags & 0b00100000);

    // test schedule
    TEST_ASSERT(EEPROM.read(offset + OFFSET_MEASURES_SCH) == schedule);


    /**** without timestamp case test  ****/
    schedule = 0;
    timestamp = false;
    test.set_struct(offset, timestamp, is_final, photo_sensor, temp_sensor, schedule, nb_photo_sensor, nb_temp_sensor, sizeofuint8, sizeofuint8);

    flags = EEPROM.read(offset);

    // test schedule flags
    TEST_ASSERT(!(flags & 0b01000000));
    TEST_ASSERT(!(flags & 0b00100000));

    // test schedule
    TEST_ASSERT(EEPROM.read(offset + OFFSET_MEASURES_SCH) == schedule);


    /**** without a type of sensor  ****/
    schedule = 0;
    timestamp = true;
    photo_sensor = true;
    nb_photo_sensor = 14;
    temp_sensor = false;
    nb_temp_sensor = 0;
    test.set_struct(offset, timestamp, is_final, photo_sensor, temp_sensor, schedule, nb_photo_sensor, nb_temp_sensor, sizeofuint8, sizeofuint8);

    flags = EEPROM.read(offset);

    // test photo res flag
    TEST_ASSERT(flags & 0b00010000);
    TEST_ASSERT(EEPROM.read(offset + OFFSET_NB_PHOTO_SENSOR) == nb_photo_sensor);

    // test temp flag
    TEST_ASSERT(!(flags & 0b00001000));
    TEST_ASSERT(EEPROM.read(offset + OFFSET_NB_TEMP_SENSOR) == nb_temp_sensor);

    photo_sensor = false;
    nb_photo_sensor = 0;
    temp_sensor = true;
    nb_temp_sensor = 15;
    test.set_struct(offset, timestamp, is_final, photo_sensor, temp_sensor, schedule, nb_photo_sensor, nb_temp_sensor, sizeofuint8, sizeofuint8);

    flags = EEPROM.read(offset);

    // test photo res flag
    TEST_ASSERT(!(flags & 0b00010000));
    TEST_ASSERT(EEPROM.read(offset + OFFSET_NB_PHOTO_SENSOR) == nb_photo_sensor);

    // test temp flag
    TEST_ASSERT(flags & 0b00001000);
    TEST_ASSERT(EEPROM.read(offset + OFFSET_NB_TEMP_SENSOR) == nb_temp_sensor);
}

void test_get_struct(){
    
    Storage_interface test;
    uint16_t offset = 0, r_next_package, r_nb_measures;
    uint8_t schedule = 0, nb_photo_sensor = 2, nb_temp_sensor = 1, sizeofuint8 = sizeof(uint8_t);
    bool timestamp = true, is_final = true, photo_sensor = true, temp_sensor = true;

    /****  classic case test ****/
    test.set_struct(offset, timestamp, is_final, photo_sensor, temp_sensor, schedule, nb_photo_sensor, nb_temp_sensor, sizeofuint8, sizeofuint8);
    
    uint8_t r_schedule, r_nb_photo_sensor, r_nb_temp_sensor, r_sizeof_temp, r_sizeof_photo;
    bool r_timestamp, r_is_final, r_photo_sensor, r_temp_sensor;
    //uint8_t flags;
    //flags = EEPROM.read(offset);

    test.get_struct(offset, &r_timestamp, &r_is_final, &r_photo_sensor, &r_temp_sensor, &r_schedule, &r_nb_photo_sensor, &r_nb_temp_sensor, &r_sizeof_photo, &r_sizeof_temp, &r_next_package, &r_nb_measures);

    // test if this package is the latest write
    TEST_ASSERT(r_is_final);

    //EEPROM.get(offset + OFFSET_NB_MEASURES, r_nb_measures);
    TEST_ASSERT(EEPROM.read(offset + OFFSET_PHOTO_MEASURES_SIZE) == sizeofuint8);
    TEST_ASSERT(r_nb_measures == 0);
    TEST_ASSERT(r_timestamp == timestamp);
    TEST_ASSERT(r_photo_sensor == photo_sensor);
    TEST_ASSERT(r_temp_sensor == temp_sensor);
    TEST_ASSERT(r_schedule == schedule);
    TEST_ASSERT(r_nb_photo_sensor == nb_photo_sensor);
    TEST_ASSERT(r_nb_temp_sensor == nb_temp_sensor);
    TEST_ASSERT(r_sizeof_temp == sizeofuint8);
    TEST_ASSERT(r_sizeof_photo == sizeofuint8);
}

void test_add_measure(){
    // test if every values is normaly store

    Storage_interface test;
    uint16_t offset = 0, reading_head;
    uint8_t schedule = 0, nb_photo_sensor = 2, nb_temp_sensor = 1, sizeofuint8 = sizeof(uint8_t);
    
    // Useless folowing EEPROM.GET, here only for avoid wrong flags of unused variable of reading_head
    EEPROM.get(offset, reading_head);

    bool timestamp = true, is_final = true, photo_sensor = true, temp_sensor = true;

    test.set_struct(offset, timestamp, is_final, photo_sensor, temp_sensor, schedule, nb_photo_sensor, nb_temp_sensor, sizeofuint8, sizeofuint8);

    uint8_t photo_val_array[nb_photo_sensor], temp_val_array[nb_temp_sensor];
    for (int i = 0; i < nb_photo_sensor; i++){
        photo_val_array[i] = i;
    }
    for (int i = 0; i < nb_temp_sensor; i++){
        temp_val_array[i] = i;
    }
    test.add_measure(photo_val_array, temp_val_array, epoch, nb_photo_sensor, nb_temp_sensor);

    uint32_t horo;
    EEPROM.get(offset + OFFSET_START_DATA_MEASURES, horo);
    TEST_ASSERT(horo == epoch);

    for (int i = 0, reading_head = offset + OFFSET_START_DATA_MEASURES + sizeof(uint32_t); i < nb_photo_sensor; i++, reading_head += sizeofuint8){
        TEST_ASSERT(EEPROM.read(reading_head) == photo_val_array[i]);
    }
    for (int i = 0, reading_head = offset + OFFSET_START_DATA_MEASURES + sizeof(uint32_t) + sizeofuint8 * nb_photo_sensor; i < nb_temp_sensor; i++, reading_head += sizeofuint8){
        TEST_ASSERT(EEPROM.read(reading_head) == temp_val_array[i]);
    }
}


// void test_get_measure(){
//     Storage_interface test;
//     uint16_t offset = 0, reading_head;
//     uint8_t schedule = 0, nb_photo_sensor = 2, nb_temp_sensor = 1, sizeofuint8 = sizeof(uint8_t);
    
//     // Useless folowing EEPROM.GET, here only for avoid wrong flags of unused variable of reading_head
//     EEPROM.get(offset, reading_head);

//     bool timestamp = true, is_final = true, photo_sensor = true, temp_sensor = true;

//     test.set_struct(offset, timestamp, is_final, photo_sensor, temp_sensor, schedule, nb_photo_sensor, nb_temp_sensor, sizeofuint8, sizeofuint8);

//     uint8_t photo_val_array[nb_photo_sensor], temp_val_array[nb_temp_sensor];
//     for (int i = 0; i < nb_photo_sensor; i++){
//         photo_val_array[i] = i;
//     }
//     for (int i = 0; i < nb_temp_sensor; i++){
//         temp_val_array[i] = i;
//     }

//     // test on first measure of the first package
//     test.add_measure(photo_val_array, temp_val_array, epoch, nb_photo_sensor, nb_temp_sensor);

//     uint32_t v_epoch;
//     uint8_t v_photo_val_array[nb_photo_sensor], v_temp_val_array[nb_temp_sensor];
//     test.get_measure(v_photo_val_array, v_temp_val_array, &v_epoch, &nb_photo_sensor, &nb_temp_sensor, 0);

//     TEST_ASSERT(v_epoch == epoch);

//     for (int i = 0; i < nb_photo_sensor; i++){
//         TEST_ASSERT(v_photo_val_array[i] == photo_val_array[i]);
//     }
//     for (int i = 0; i < nb_temp_sensor; i++){
//         TEST_ASSERT(v_temp_val_array[i] == temp_val_array[i]);
//     }

//     // test on the second measure of the first package
//     test.add_measure(photo_val_array, temp_val_array, epoch, nb_photo_sensor, nb_temp_sensor);

//     test.get_measure(v_photo_val_array, v_temp_val_array, &v_epoch, &nb_photo_sensor, &nb_temp_sensor, 1);

//     TEST_ASSERT(v_epoch == epoch);

//     for (int i = 0; i < nb_photo_sensor; i++){
//         TEST_ASSERT(v_photo_val_array[i] == photo_val_array[i]);
//     }
//     for (int i = 0; i < nb_temp_sensor; i++){
//         TEST_ASSERT(v_temp_val_array[i] == temp_val_array[i]);
//     }

//     // test on the first measure of the seconde package
//     test.add_last_package(timestamp, is_final, photo_sensor, temp_sensor, schedule, nb_photo_sensor, nb_temp_sensor, sizeofuint8, sizeofuint8);
//     test.add_measure(photo_val_array, temp_val_array, epoch, nb_photo_sensor, nb_temp_sensor);

//     test.get_measure(v_photo_val_array, v_temp_val_array, &v_epoch, &nb_photo_sensor, &nb_temp_sensor, 0);

//     TEST_ASSERT(v_epoch == epoch);

//     for (int i = 0; i < nb_photo_sensor; i++){
//         TEST_ASSERT(v_photo_val_array[i] == photo_val_array[i]);
//     }
//     for (int i = 0; i < nb_temp_sensor; i++){
//         TEST_ASSERT(v_temp_val_array[i] == temp_val_array[i]);
//     }
// }

void test_get_measure_at(){
    Storage_interface test;
    uint16_t offset = 0, reading_head;
    uint8_t schedule = 0, nb_photo_sensor = 2, nb_temp_sensor = 1, sizeofuint8 = sizeof(uint8_t);
    
    // Useless folowing EEPROM.GET, here only for avoid wrong flags of unused variable of reading_head
    EEPROM.get(offset, reading_head);

    bool timestamp = true, is_final = true, photo_sensor = true, temp_sensor = true;

    test.set_struct(offset, timestamp, is_final, photo_sensor, temp_sensor, schedule, nb_photo_sensor, nb_temp_sensor, sizeofuint8, sizeofuint8);

    uint8_t photo_val_array[nb_photo_sensor], temp_val_array[nb_temp_sensor];
    for (int i = 0; i < nb_photo_sensor; i++){
        photo_val_array[i] = i;
    }
    for (int i = 0; i < nb_temp_sensor; i++){
        temp_val_array[i] = i;
    }

    // test on first measure of the first package
    test.add_measure(photo_val_array, temp_val_array, epoch, nb_photo_sensor, nb_temp_sensor);

    uint32_t v_epoch;
    uint8_t v_photo_val_array[nb_photo_sensor], v_temp_val_array[nb_temp_sensor];
    test.get_measure_at(v_photo_val_array, v_temp_val_array, &v_epoch, &nb_photo_sensor, &nb_temp_sensor, 0, 0);

    TEST_ASSERT(v_epoch == epoch);

    for (int i = 0, reading_head = offset + OFFSET_START_DATA_MEASURES + sizeof(uint32_t); i < nb_photo_sensor; i++, reading_head += sizeofuint8){
        TEST_ASSERT(v_photo_val_array[i] == photo_val_array[i]);
    }
    for (int i = 0, reading_head = offset + OFFSET_START_DATA_MEASURES + sizeof(uint32_t) + sizeofuint8 * nb_photo_sensor; i < nb_temp_sensor; i++, reading_head += sizeofuint8){
        TEST_ASSERT(v_temp_val_array[i] == temp_val_array[i]);
    }

    // test on the second measure of the first package
    test.add_measure(photo_val_array, temp_val_array, epoch, nb_photo_sensor, nb_temp_sensor);

    test.get_measure_at(v_photo_val_array, v_temp_val_array, &v_epoch, &nb_photo_sensor, &nb_temp_sensor, 0, 1);

    TEST_ASSERT(v_epoch == epoch);

    for (int i = 0; i < nb_photo_sensor; i++){
        TEST_ASSERT(v_photo_val_array[i] == photo_val_array[i]);
    }
    for (int i = 0; i < nb_temp_sensor; i++){
        TEST_ASSERT(v_temp_val_array[i] == temp_val_array[i]);
    }

    // test on the first measure of the seconde package
    test.add_last_package(timestamp, is_final, photo_sensor, temp_sensor, schedule, nb_photo_sensor, nb_temp_sensor, sizeofuint8, sizeofuint8);
    test.add_measure(photo_val_array, temp_val_array, epoch, nb_photo_sensor, nb_temp_sensor);

    test.get_measure_at(v_photo_val_array, v_temp_val_array, &v_epoch, &nb_photo_sensor, &nb_temp_sensor, 1, 0);

    TEST_ASSERT(v_epoch == epoch);

    for (int i = 0; i < nb_photo_sensor; i++){
        TEST_ASSERT(v_photo_val_array[i] == photo_val_array[i]);
    }
    for (int i = 0; i < nb_temp_sensor; i++){
        TEST_ASSERT(v_temp_val_array[i] == temp_val_array[i]);
    }
}



void setup(void)
{
    Serial.begin(9600);
}

//WARNING: Tests are not exhaustive and do not cover all possibilities.
int main( int argc, char **argv) {
    UNITY_BEGIN();
    // RUN_TEST(test_get_measure);
    RUN_TEST(test_get_measure_at);
    RUN_TEST(test_add_measure);
    RUN_TEST(test_get_struct);
    RUN_TEST(test_set_struct);
    // RUN_TEST(test_put_measure);
    
    UNITY_END();
}